"Test Data Compression for System-on-chip using Flexible Runs-aware PRL Coding."

Haiying Yuan et al. (2016)

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DOI: 10.1007/S10836-016-5595-Z

access: closed

type: Journal Article

metadata version: 2020-09-11

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Haiying Yuan, Zijian Ju, Xun Sun, Kun Guo, Xiuyu Wang:
Test Data Compression for System-on-chip using Flexible Runs-aware PRL Coding. J. Electron. Test. 32(5): 639-647 (2016)

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