"A Novel Test Point Selection Method for Analog Fault Dictionary Techniques."

Chenglin Yang et al. (2010)

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DOI: 10.1007/S10836-010-5169-4

access: closed

type: Journal Article

metadata version: 2020-09-11

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Chenglin Yang, Shulin Tian, Bing Long, Fang Chen:
A Novel Test Point Selection Method for Analog Fault Dictionary Techniques. J. Electron. Test. 26(5): 523-534 (2010)

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