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"Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores."

Carsten Wegener et al. (2009)

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DOI: 10.1007/S10836-009-5118-2

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/WegenerMKDS09
Carsten Wegener, Heinz Mattes, Stéphane Kirmser, Frank Demmerle, Sebastian Sattler:
Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores. J. Electron. Test. 25(6): 301-308 (2009)

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