"Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling."

R. de Vries, Augustus J. E. M. Janssen (1999)

> Home

Details and statistics

DOI: 10.1023/A:1008395125678

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/VriesJ99
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/VriesJ99
R. de Vries, Augustus J. E. M. Janssen:
Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling. J. Electron. Test. 15(1-2): 23-29 (1999)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.