"A general purpose design-for-test methodology at the analog-digital ..."

Johan Verfaillie, Didier Haspeslagh (1996)

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DOI: 10.1007/BF00137568

access: closed

type: Journal Article

metadata version: 2020-09-11

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Johan Verfaillie, Didier Haspeslagh:
A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI. J. Electron. Test. 9(1-2): 109-115 (1996)

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