"On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with ..."

Daniela De Venuto, Michael J. Ohletz (2001)

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DOI: 10.1023/A:1013377811693

access: closed

type: Journal Article

metadata version: 2020-09-11

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Daniela De Venuto, Michael J. Ohletz:
On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages. J. Electron. Test. 17(3-4): 243-253 (2001)

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