"Functional Fault Equivalence and Diagnostic Test Generation in ..."

Andreas G. Veneris et al. (2005)

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DOI: 10.1007/S10836-005-1543-Z

access: closed

type: Journal Article

metadata version: 2020-09-11

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Andreas G. Veneris, Robert Chang, Magdy S. Abadir, Sep Seyedi:
Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPG. J. Electron. Test. 21(5): 495-502 (2005)

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