Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Test quality of hierarchical defect-tolerant integrated circuits."

Claude Thibeault, Yvon Savaria, Jean-Louis Houle (1992)

> Home

Details and statistics

DOI: 10.1007/BF00159834

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/ThibeaultSH92
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/ThibeaultSH92
Claude Thibeault, Yvon Savaria, Jean-Louis Houle:
Test quality of hierarchical defect-tolerant integrated circuits. J. Electron. Test. 3(1): 93-102 (1992)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.