"Generation and Verification of Tests for Analog Circuits Subject to ..."

Stephen J. Spinks et al. (2004)

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DOI: 10.1023/B:JETT.0000009310.48706.B7

access: closed

type: Journal Article

metadata version: 2020-09-11

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Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski:
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations. J. Electron. Test. 20(1): 11-23 (2004)

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