"An Automated BIST Architecture for Testing and Diagnosing FPGA ..."

Jack R. Smith, Tian Xia, Charles E. Stroud (2006)

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DOI: 10.1007/S10836-006-9319-7

access: closed

type: Journal Article

metadata version: 2020-09-11

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Jack R. Smith, Tian Xia, Charles E. Stroud:
An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults. J. Electron. Test. 22(3): 239-253 (2006)

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