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"Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in ..."

Zhen Shi, Peter Sandborn (2006)

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DOI: 10.1007/S10836-006-6593-3

access: closed

type: Journal Article

metadata version: 2020-09-11

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Zhen Shi, Peter Sandborn:
Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly. J. Electron. Test. 22(1): 49-60 (2006)

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