"Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational ..."

Toral Shah et al. (2018)

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DOI: 10.1007/S10836-018-5703-3

access: closed

type: Journal Article

metadata version: 2020-09-11

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Toral Shah, Anzhela Yu. Matrosova, Masahiro Fujita, Virendra Singh:
Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design. J. Electron. Test. 34(1): 53-65 (2018)

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