"On Random Pattern Testability of Cryptographic VLSI Cores."

A. Schubert, Walter Anheier (2000)

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DOI: 10.1023/A:1008378912411

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type: Journal Article

metadata version: 2020-09-11

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A. Schubert, Walter Anheier:
On Random Pattern Testability of Cryptographic VLSI Cores. J. Electron. Test. 16(3): 185-192 (2000)

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