"Current Consumption and Power Integrity of CMOS Digital Circuits Under ..."

Jose María Ruíz et al. (2012)

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DOI: 10.1007/S10836-012-5337-9

access: closed

type: Journal Article

metadata version: 2020-09-11

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Jose María Ruíz, Raúl Fernández-García, Ignacio Gil, Marta Morata:
Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI Wearout. J. Electron. Test. 28(6): 865-868 (2012)

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