"A Survey and Recent Advances: Machine Intelligence in Electronic Testing."

Soham Roy, Spencer K. Millican, Vishwani D. Agrawal (2024)

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DOI: 10.1007/S10836-024-06117-7

access: closed

type: Journal Article

metadata version: 2024-07-04

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Soham Roy, Spencer K. Millican, Vishwani D. Agrawal:
A Survey and Recent Advances: Machine Intelligence in Electronic Testing. J. Electron. Test. 40(2): 139-158 (2024)

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