"A Built-in-Self-Test Scheme for Segmented and Binary Weighted DACs."

Sunil Rafeeque, Vinita Vasudevan (2004)

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DOI: 10.1007/S10677-004-4250-4

access: closed

type: Journal Article

metadata version: 2020-09-11

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Sunil Rafeeque, Vinita Vasudevan:
A Built-in-Self-Test Scheme for Segmented and Binary Weighted DACs. J. Electron. Test. 20(6): 623-638 (2004)

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