"A data optimization test technique for characterizing embedded ADCs."

J. Raczkowycz, S. Allott, T. I. Pritchard (1996)

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DOI: 10.1007/BF00137572

access: closed

type: Journal Article

metadata version: 2020-09-11

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J. Raczkowycz, S. Allott, T. I. Pritchard:
A data optimization test technique for characterizing embedded ADCs. J. Electron. Test. 9(1-2): 165-175 (1996)

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