"A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied ..."

Ken Posse (1997)

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DOI: 10.1023/A:1008282800908

access: closed

type: Journal Article

metadata version: 2020-09-11

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Ken Posse:
A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules. J. Electron. Test. 10(1-2): 119-125 (1997)

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