"Quality Determination for Gate Delay Fault Tests Considering Three-State ..."

Frank Poehl, Walter Anheier (1999)

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DOI: 10.1023/A:1008345221488

access: closed

type: Journal Article

metadata version: 2020-09-11

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Frank Poehl, Walter Anheier:
Quality Determination for Gate Delay Fault Tests Considering Three-State Elements. J. Electron. Test. 14(1-2): 49-55 (1999)

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