"Testability-based partial scan analysis."

Prashant S. Parikh, Miron Abramovici (1995)

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DOI: 10.1007/BF00993314

access: closed

type: Journal Article

metadata version: 2020-09-11

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Prashant S. Parikh, Miron Abramovici:
Testability-based partial scan analysis. J. Electron. Test. 7(1-2): 61-70 (1995)

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