"Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision."

Yuqi Pan et al. (2024)

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DOI: 10.1007/S10836-024-06125-7

access: closed

type: Journal Article

metadata version: 2024-08-22

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Yuqi Pan, Huaguo Liang, Junming Li, Jinxing Qu, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision. J. Electron. Test. 40(3): 405-415 (2024)

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