"A New Design-for-Testability Method Based on Thru-Testability."

Chia Yee Ooi, Hideo Fujiwara (2011)

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DOI: 10.1007/S10836-011-5241-8

access: closed

type: Journal Article

metadata version: 2020-09-11

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Chia Yee Ooi, Hideo Fujiwara:
A New Design-for-Testability Method Based on Thru-Testability. J. Electron. Test. 27(5): 583-598 (2011)

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