"A Non-Scan Approach to DFT for Controllers Achieving 100% Fault Efficiency."

Satoshi Ohtake, Toshimitsu Masuzawa, Hideo Fujiwara (2000)

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DOI: 10.1023/A:1008333102734

access: closed

type: Journal Article

metadata version: 2020-09-11

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Satoshi Ohtake, Toshimitsu Masuzawa, Hideo Fujiwara:
A Non-Scan Approach to DFT for Controllers Achieving 100% Fault Efficiency. J. Electron. Test. 16(5): 553-566 (2000)

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