"Testability Trade-Offs for BIST Data Paths."

Nicola Nicolici, Bashir M. Al-Hashimi (2004)

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DOI: 10.1023/B:JETT.0000023680.46155.65

access: closed

type: Journal Article

metadata version: 2020-09-11

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Nicola Nicolici, Bashir M. Al-Hashimi:
Testability Trade-Offs for BIST Data Paths. J. Electron. Test. 20(2): 169-179 (2004)

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