"Improving quality: Yield versus test coverage."

Steven D. Millman (1994)

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DOI: 10.1007/BF00972084

access: closed

type: Journal Article

metadata version: 2020-09-11

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Steven D. Millman:
Improving quality: Yield versus test coverage. J. Electron. Test. 5(2-3): 253-261 (1994)

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