"Analysis and Fault Modeling of Actual Resistive Defects in ATMEL ..."

Pierre-Didier Mauroux et al. (2012)

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DOI: 10.1007/S10836-012-5277-4

access: closed

type: Journal Article

metadata version: 2020-09-11

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Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez:
Analysis and Fault Modeling of Actual Resistive Defects in ATMEL TSTAC^TM eFlash Memories. J. Electron. Test. 28(2): 215-228 (2012)

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