"Address Remapping Techniques for Enhancing Fabrication Yield of Embedded ..."

Shyue-Kung Lu et al. (2018)

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DOI: 10.1007/S10836-018-5741-X

access: closed

type: Journal Article

metadata version: 2020-09-11

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Shyue-Kung Lu, Hao-Cheng Jheng, Hao-Wei Lin, Masaki Hashizume:
Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories. J. Electron. Test. 34(4): 435-446 (2018)

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