"Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata."

Mo Liu, Craig S. Lent (2007)

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DOI: 10.1007/S10836-006-0627-8

access: closed

type: Journal Article

metadata version: 2022-06-13

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Mo Liu, Craig S. Lent:
Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata. J. Electron. Test. 23(2-3): 211-218 (2007)

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