"An Analytical Model for Deposited Charge of Single Event Transient (SET) ..."

Baojun Liu, Li Cai, Chuang Li (2024)

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DOI: 10.1007/S10836-024-06109-7

access: closed

type: Journal Article

metadata version: 2024-07-04

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Baojun Liu, Li Cai, Chuang Li:
An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFET. J. Electron. Test. 40(2): 159-169 (2024)

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