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"A New Scan Architecture for Both Low Power Testing and Test Volume ..."
Hong-Sik Kim, Sungho Kang, Michael S. Hsiao (2008)
- Hong-Sik Kim, Sungho Kang, Michael S. Hsiao:
A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment. J. Electron. Test. 24(4): 365-378 (2008)
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