"Combining GAs and Symbolic Methods for High Quality Tests of Sequential ..."

Martin Keim et al. (2001)

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DOI: 10.1023/A:1011193725824

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type: Journal Article

metadata version: 2023-03-21

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Martin Keim, Nicole Drechsler, Rolf Drechsler, Bernd Becker:
Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. J. Electron. Test. 17(1): 37-51 (2001)

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