"Functional versus random test generation for sequential circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Margot Karam, Gabriele Saucier (1993)

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DOI: 10.1007/BF00971938

access: closed

type: Journal Article

metadata version: 2020-09-11

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Margot Karam, Gabriele Saucier:
Functional versus random test generation for sequential circuits. J. Electron. Test. 4(1): 33-41 (1993)

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