"Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift."

Hui Jiang et al. (2023)

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DOI: 10.1007/S10836-023-06060-Z

access: open

type: Journal Article

metadata version: 2023-11-12

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Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas:
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift. J. Electron. Test. 39(2): 227-243 (2023)

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