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"Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip."

Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen (2002)

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DOI: 10.1023/A:1014916913577

access: closed

type: Journal Article

metadata version: 2024-02-05

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Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen:
Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip. J. Electron. Test. 18(2): 213-230 (2002)

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