"Dynamic Power Integrity Control of ATE for Eliminating Overkills and ..."

Masahiro Ishida et al. (2016)

> Home

Details and statistics

DOI: 10.1007/S10836-016-5582-4

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/IshidaNKKA16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/IshidaNKKA16
Masahiro Ishida, Toru Nakura, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada:
Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing. J. Electron. Test. 32(3): 257-271 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.