"Yield fluctuations and defect models."

Leendert M. Huisman (1995)

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DOI: 10.1007/BF00995316

access: closed

type: Journal Article

metadata version: 2020-09-11

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Leendert M. Huisman:
Yield fluctuations and defect models. J. Electron. Test. 7(3): 241-254 (1995)

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