"Performance Degradation Tolerance Analysis and Design for Effective Yield ..."

Tong-Yu Hsieh et al. (2015)

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DOI: 10.1007/S10836-015-5546-0

access: closed

type: Journal Article

metadata version: 2020-09-11

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Tong-Yu Hsieh, Chih-Hao Wang, Chun-Wei Kuo, Shu-Yu Huang, Tsung-Liang Chih:
Performance Degradation Tolerance Analysis and Design for Effective Yield Enhancement. J. Electron. Test. 31(5-6): 427-441 (2015)

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