"Efficient Error-Tolerability Testing on Image Processing Circuits Based on ..."

Tong-Yu Hsieh, Yi-Han Peng, Kuan-Hsien Li (2014)

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DOI: 10.1007/S10836-014-5488-Y

access: closed

type: Journal Article

metadata version: 2020-09-11

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Tong-Yu Hsieh, Yi-Han Peng, Kuan-Hsien Li:
Efficient Error-Tolerability Testing on Image Processing Circuits Based on Equivalent Error Rate Transformation. J. Electron. Test. 30(6): 687-699 (2014)

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