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"Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving."

Zhiyuan He et al. (2008)

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DOI: 10.1007/S10836-007-5030-6

access: closed

type: Journal Article

metadata version: 2022-08-09

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Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinger, Bashir M. Al-Hashimi:
Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving. J. Electron. Test. 24(1-3): 247-257 (2008)

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