"Off-Chip Skew Measurement and Compensation Module (SMCM) Design for ..."

Kihyuk Han et al. (2011)

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DOI: 10.1007/S10836-011-5213-Z

access: closed

type: Journal Article

metadata version: 2020-09-11

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Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham:
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. J. Electron. Test. 27(4): 429-439 (2011)

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