"Failure Analysis of VLSI by I_DDQ Testing."

Steven Haehn, T. S. Kalkur (1997)

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DOI: 10.1023/A:1008222607359

access: closed

type: Journal Article

metadata version: 2020-09-11

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Steven Haehn, T. S. Kalkur:
Failure Analysis of VLSI by I_DDQ Testing. J. Electron. Test. 11(3): 273-283 (1997)

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