"Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems."

Fernando M. Gonçalves, João Paulo Teixeira (1999)

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DOI: 10.1023/A:1008351310657

access: closed

type: Journal Article

metadata version: 2022-10-05

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Fernando M. Gonçalves, João Paulo Teixeira:
Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems. J. Electron. Test. 15(1-2): 41-52 (1999)

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