"Behavioral Level Noise Modeling and Jitter Simulation of Phase-Locked ..."

Nihal J. Godambe, Chuanjin Richard Shi (1998)

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DOI: 10.1023/A:1008329031457

access: closed

type: Journal Article

metadata version: 2024-09-11

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Nihal J. Godambe, Chuanjin Richard Shi:
Behavioral Level Noise Modeling and Jitter Simulation of Phase-Locked Loops with Faults Using VHDL-AMS. J. Electron. Test. 13(1): 7-17 (1998)

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