"A Layout Sensitivity Model for Estimating Electromigration-vulnerable ..."

Rani S. Ghaida, Payman Zarkesh-Ha (2009)

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DOI: 10.1007/S10836-008-5079-X

access: closed

type: Journal Article

metadata version: 2020-09-11

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Rani S. Ghaida, Payman Zarkesh-Ha:
A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects. J. Electron. Test. 25(1): 67-77 (2009)

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