"Self-Timed Boundary-Scan Cells for Multi-Chip Module Test."

T. A. García et al. (1999)

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DOI: 10.1023/A:1008388318835

access: closed

type: Journal Article

metadata version: 2022-06-03

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T. A. García, Antonio J. Acosta, J. M. Mora, J. Ramos, José Luis Huertas:
Self-Timed Boundary-Scan Cells for Multi-Chip Module Test. J. Electron. Test. 15(1-2): 115-127 (1999)

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