"Scan test architectures for digital board testers."

Matthew L. Fichtenbaum, Gordon D. Robinson (1991)

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DOI: 10.1007/BF00134946

access: closed

type: Journal Article

metadata version: 2020-09-11

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Matthew L. Fichtenbaum, Gordon D. Robinson:
Scan test architectures for digital board testers. J. Electron. Test. 2(1): 99-105 (1991)

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