"Bilateral Testing of Nano-scale Fault-Tolerant Circuits."

Lei Fang, Michael S. Hsiao (2008)

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DOI: 10.1007/S10836-007-5041-3

access: closed

type: Journal Article

metadata version: 2020-09-11

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Lei Fang, Michael S. Hsiao:
Bilateral Testing of Nano-scale Fault-Tolerant Circuits. J. Electron. Test. 24(1-3): 285-296 (2008)

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