"RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences."

Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara (2010)

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DOI: 10.1007/S10836-009-5135-1

access: closed

type: Journal Article

metadata version: 2022-01-03

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Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara:
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences. J. Electron. Test. 26(2): 151-164 (2010)

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