"Integrated Design and Test of Mixed-Signal Circuits."

Nur Engin et al. (1999)

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DOI: 10.1023/A:1008301406467

access: closed

type: Journal Article

metadata version: 2020-09-11

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Nur Engin, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek:
Integrated Design and Test of Mixed-Signal Circuits. J. Electron. Test. 14(1-2): 75-83 (1999)

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