"Automatic Test Pattern Generation for Resistive Bridging Faults."

Piet Engelke et al. (2006)

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DOI: 10.1007/S10836-006-6392-X

access: closed

type: Journal Article

metadata version: 2020-09-11

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Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker:
Automatic Test Pattern Generation for Resistive Bridging Faults. J. Electron. Test. 22(1): 61-69 (2006)

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